Semiconductor Device Probe Stations*
Probe Station, Micromanipulator
6150-USMC-V2-1-0
Semiautomatic
Probe Station, Cascade Summit S12751
Wentworth PROBE STATION MODEL
0-023-0008
Semiconductor Device Analysers*
Semiconductor Parameter Analyzer,
HP4156A
Semiconductor Parameter Analyzer,
Agilent 4156C
Simultaneous C-V System,
Keithley
Optical Instruments*
Infrared Thermal Camera System,
TVS-8502
Near InfraRed (NIR)
Photomultiplier Tube (PMT) System
Time-resolved Intensified CCD (ICCD)
Detector System
Optical Microscopes
Sample Preparation Equipment
Plastic Mold Decapsulation System,
NSC PA103*
Sputter Coater
Tube furnaces, 3-zone, 3"*
Vacuum Evaporation System, Edwards
Auto 306
Wire Bonder
*Note that these equipment are
for internal use only
