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Automated Integrated Test System (AITS)
Cathodoluminescence (CL) System
FE Induced NWs Growth and Characterisation Systems
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International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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IEEE Transactions on Electron Devices
Japanese Journal of Applied Physics
Microelectronics Reliability
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The Journal of The Electrochemical Society
Applied Physics Letters
IEEE International Integrated Reliability Workshop aka Wafer Level Reliability Workshop
Semiconductors
"Microchip Fabrication" - information website for students, scientists, process engineers and others involved in semiconductor research and manufacturing
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