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Administrators |
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Associate Professor THONG Thiam Leong, John
PhD MA BA (Camb.)
Director of CICFAR
Scanning electron microscopy; electron beam lithography;
scanning probe microscopy; nanofabrication techniques, and nanoscale devices. Nanowires and nanotubes. Novel electron
sources.
Tel: 6516 2270 Email:
elettl@nus.edu.sg
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Mr KOO Chee Keong
MSc (NTU)
Professional Officer, Centre Manager
CICFAR admin; organization of
research seminars; resource person in design of new instruments and
projects in CICFAR; help and train new research students;
operation and maintenance of equipment.
Scanning electron microscopy; electron beam lithography; resource person for PC software development and assist in
resolving PC related issues.
Tel: 6516 2244 / 6516 1568 Email:
elekoock@nus.edu.sg
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Mrs
HO Chiow Mooi
Dipl
Principal Laboratory Officer
CICFAR Admin., management of daily operational activities,
management of equipment booking, laboratory purchases, operation
and maintenance of equipment.
Tel: 6516 2244 / 6516 1568 Email:
elehocm@nus.edu.sg
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Ms LI Yong Ling Anna
B. Deg
Laboratory Officer
CICFAR2 Admin., management of daily operational activities,
operation and maintenance of equipment.
Tel: 6516 3890 Email:
elelia@nus.edu.sg
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PRINCIPAL
INVESTIGATORS |
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Associate Professor
Anjam KHURSHEED
PhD BSc (Edin.)
Computational electron optics; Computational electromagnetics.
Tel: 6516 2295 Email:
eleka@nus.edu.sg
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Professor CHAN Siu Hung,
Daniel
PhD (Salf.), MSc BSc (UMIST)
Cathodoluminescence, voltage contrast and electron beam induced
currents in the scanning electron microscope; Integrated circuit
failure analysis techniques and reliability mechanisms.
Tel: 6516 2117 Email:
elecshd@nus.edu.sg
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Associate Professor CHIM
Wai Kin
PhD BEng (NUS)
Scanning electron microscopy; Magnetic contrast, voltage
contrast and cathodoluminescence; Photon emission microscopy;
Hot carrier studies; Oxide reliability; Scanning probe
microscopy; Failure analysis and reliability of ICs and
optoelectronics devices.
Tel: 6516 6287 Email:
elecwk@nus.edu.sg
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Associate Professor CHO
Byung-Jin
PhD BSc (KAIST)
Gate oxide integrity (reliability and process development); CMOS
device isolation technology; Shallow and deep well junction
formation; Rapid thermal processor design and related
processing.
Tel: 6516 6470 Email:
elebjcho@nus.edu.sg
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Associate Professor CHOI Wee Kiong
PhD MBA BSc (Edin.)
Properties of thin oxide films; Electronic and Optical
properties of SiC; Electronic and Non-linear optical properties
of amorphous; Threshold switching in metal-thin
insulator-semiconductor structures.
Tel: 6516 6473 Email:
elechoi@nus.edu.sg
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Professor LI Ming Fu
Dipl Fudan, MIES, SrMIEEE, MMRS
Defects in semiconductor materials and devices; Physics related
to device reliability; Analog integrated circuit design;
Semiconductor material and device properties by pseudopotential
calculations.
Tel: 6516 2559 Email:
elelimf@nus.edu.sg
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Assistant Professor NG Vivian
PhD (Camb.) BSc (Lond.)
Thin film deposition; Fabrication and characterisation of
nanostructures; Scanning thermal microscopy.
Tel: 6516 2573 Email:
elengv@nus.edu.sg
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Professor PHANG Chee Hong, Jacob
PhD MA BA (Camb.)
Scanning electron microscopy - cathodoluminescence, voltage
contrast, electron beam induced currents; Integrated circuit
failure analysis and reliability mechanisms.
Tel: 6516 2300 Email:
elejpch@nus.edu.sg
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Assistant Professor WONG Wai Kin
PhD BEng (NUS)
Electron-beam Lithography & Inspection, Failure Analysis &
Characterisation Techniques for MEMS; Fabrication,
Characterisation and Application of Nanostructures; Charge
Control Scanning Electron Microscopy; Thermal-Acoustic
Microscopy; Failure Analysis, Reliability and Yield in
Microelectronic Manufacturing; Digital Processing and adaptive
control for imaging applications.
Tel: 6516 2244 / 6516 1568 Email:
elewwk@nus.edu.sg
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RESEARCH
STAFF |
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Dr
OON Chin Hin
Tel: 6516 2244 / 6516 1568 Email:
smaoch@nus.edu.sg
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